Analytical Capabilities

Analytical Capabilities

 

Soleras’ in-house analytical and materials characterization capabilities include the following:

  • ICP-OES (inductively coupled plasma optical emission spectrometry) to detect trace metals
  • Gas analysis for emission and process monitoring
  • SEM (scanning electron microscopy) with EDS (energy dispersive spectroscopy) for analysis of materials and surfaces
  • Metallography to determine physical structure and components of metals
  • Particle-size analysis
  • Density, hardness, surface and cross-sectional measurement
  • Phased array ultrasonic inspection
  • Magnetic flux mapping
  • CMM (coordinate measurement machine)
  • Vacuum helium leak detection
  • XRF (x-ray fluorescence)

 

 

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